E-Learning – ISO 12406:2010

May 17, 2024

E-Learning – ISO 12406:2010

Jadwal Pelatihan E-Learning – ISO 12406:2010

TanggalTempatKota
04 - 05 Juni 2024--

Deskripsi

ISO 12406:2010 specifies a secondary-ion mass spectrometric method using magnetic-sector or quadrupole mass spectrometers for depth profiling of arsenic in silicon, and using stylus profilometry or optical interferometry for depth calibration. This method is applicable to single-crystal, poly-crystal or amorphous silicon specimens with arsenic atomic concentrations between 1 x 10 16 atoms/cm 3 and 2,5 x 10 21 atoms/cm 3 and to crater depths of 50 nm or deeper.

Materi

1. Introduction ISO 12406

  • Scope
  • Normative reference
  • Term and Definitions
  • Symbols and Abbreviated Terms

2. Principle ISO 12406

3. Reference Materials

4. Apparatus

5. Specimen

6. Procedures

  • Adjustment of secondary-ion mass spectrometer
  • Optimizing the secondary-ion mass spectrometer settings
  • Specimen introduction
  • Detected ions
  • Measurement of test specimen
  • Calibration

7. Diskusi

Form Registrasi Pelatihan / Training

Jika anda berkeinginan untuk mengikuti Pelatihan E-Learning – ISO 12406:2010, anda bisa langsung menghubungi salah satu nomor kami di bawah ini:

  • (0274) 4291-355 (08:00 – 16:00)
  • 0811 2938 847

Anda juga bisa langsung mengisi Formulir pendaftaran di bawah ini:

E-Learning – ISO 12406:2010
error: Content is protected !!